The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2022
Filed:
Jun. 12, 2019
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
Hiroyuki Iida, Musashino, JP;
Tetsuya Manabe, Musashino, JP;
Yusuke Koshikiya, Musashino, JP;
Hidenobu Hirota, Musashino, JP;
Takui Uematsu, Musashino, JP;
NIPPON TELEGRAPH AND TELEPHONE CORPORATION, Tokyo, JP;
Abstract
An object of the present disclosure is to provide a frequency division multiplexing coherent OTDR, a test method, a signal processing apparatus, and a program that can maintain, even in a case where a DFB laser is used, a spatial resolution equivalent to a spatial resolution achieved when a fiber laser or an external resonant laser is used. An OTDR according to the present disclosure includes a light incidence unit configured to change an optical frequency of light from a light source by a predetermined frequency interval at a predetermined time interval to generate test light pulses and cause the test light pulses to sequentially enter a fiber under test, a light reception unit configured to use the light from the light source as local light to coherently detect backscattered light from the fiber under test to acquire a received signal, and a computation unit configured to separate the received signal into signals with frequencies obtained by changing the optical frequency by the predetermined frequency interval, square amplitudes of the signals resulting from frequency separation to generate square values, perform Wiener filter processing on the square values, compensate values resulting from the Wiener filter processing for delay time when the test light pulses are caused to enter the fiber under test, and calculate an arithmetic mean of the compensated values.