The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2022
Filed:
Aug. 06, 2020
Applicant:
Johnson & Johnson Surgical Vision, Inc., Irvine, CA (US);
Inventor:
Huawei Zhao, Saint Augustine, FL (US);
Assignee:
Johnson & Johnson Surgical Vision, Inc., Irvine, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G01M 11/02 (2006.01); H04N 5/225 (2006.01); H04N 5/372 (2011.01); G02C 7/02 (2006.01); A61F 2/16 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0257 (2013.01); A61F 2/1637 (2013.01); G01M 11/0292 (2013.01); G02C 7/02 (2013.01); H04N 5/2254 (2013.01); H04N 5/23299 (2018.08); H04N 5/372 (2013.01); A61F 2/16 (2013.01); G02C 2202/02 (2013.01);
Abstract
Methods and systems for measuring the asymmetrical image quality or image features of an intraocular lens (IOL), design, refractive and diffractive designs, such as IOLs with Extended tolerance of astigmatic effects are provided by through-focus and meridian response. Measurements are taken at various focal plane and meridian positions to allow for determination of areas of better performance away from 0 meridian or the start position and meridian.