The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Mar. 26, 2019
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventors:

Hiroshi Takahashi, Musashino, JP;

Kunihiro Toge, Musashino, JP;

Tomokazu Oda, Musashino, JP;

Tetsuya Manabe, Musashino, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/353 (2006.01);
U.S. Cl.
CPC ...
G01D 5/353 (2013.01); G01D 5/35364 (2013.01);
Abstract

An environmental property measurement apparatus includes a unit configured to receive probe light in a desired mode from one end of a measurement optical fiber, a unit configured to receive, from the other end of the measurement optical fiber, a light pulse in the desired mode as a pump light pulse with respect to the probe light, the light pulse having a frequency difference corresponding to a Brillouin frequency shift of the measurement optical fiber relative to the probe light on a high frequency side, and a unit configured to receive second probe light having the frequency difference corresponding to the Brillouin frequency shift of the measurement optical fiber relative to the probe light on a low frequency side from the other end of the measurement optical fiber, the second probe light being probe light with respect to the probe light in another mode different from the desired mode.


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