The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Oct. 07, 2019
Applicant:

Mitsumi Electric Co., Ltd., Tama, JP;

Inventor:

Satoru Suto, Tama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/02 (2006.01); G06T 7/73 (2017.01); G06T 7/593 (2017.01); H04N 13/239 (2018.01); G06T 7/60 (2017.01); H04N 5/247 (2006.01); G06V 10/40 (2022.01);
U.S. Cl.
CPC ...
G01C 3/02 (2013.01); G06T 7/593 (2017.01); G06T 7/60 (2013.01); G06T 7/73 (2017.01); G06V 10/40 (2022.01); H04N 5/247 (2013.01); H04N 13/239 (2018.05);
Abstract

The distance measuring camera includes a first imaging system for obtaining a first image, a second imaging system for obtaining a second image and a size obtaining partfor measuring a distance between a plurality of feature points of a first subject in the first image to obtain a size of the first subject image and measuring a distance between a plurality of feature points of a second subject image in the second image to obtain a size of the second subject image. The size obtaining partsearches pixels on an epipolar line only in a search area of the second image in which a first imaging area corresponding to the first image can be overlapped with a second imaging area corresponding to the second image to detect the plurality of feature points of the second subject image.


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