The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2022
Filed:
Apr. 15, 2020
Apre Instruments, Llc, Tuson, AZ (US);
Piotr Szwaykowski, Tucson, AZ (US);
APRE INSTRUMENTS, INC., Tucson, AZ (US);
Abstract
The range of measurement in spectrally controlled interferometry (SCI) is extended by superimposing multiple modulations on the low-coherence light used for the measurement. Optimally, a spectrally controllable light source modulated sinusoidally with low spectral frequency is combined with a delay line, such as provided by a Michelson interferometer. The resulting light is injected into a Fizeau interferometer to generate localized fringes at a distance corresponding to the effect of the spectrally modulated source combined with the optical path difference produced by the delay line. The combination provides a convenient way to practice SCI with all its advantages and with a range that can be extended to the degree required for any practically foreseeable application. Alternatively, a single source capable of multiple modulations can be used instead of a separate second modulator component.