The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Jan. 22, 2018
Applicant:

Ishida Co., Ltd., Kyoto, JP;

Inventors:

Koichi Makino, Ritto, JP;

Takashi Matsumoto, Ritto, JP;

Assignee:

Ishida Co., Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65B 57/14 (2006.01); G01G 19/52 (2006.01); B65B 39/00 (2006.01);
U.S. Cl.
CPC ...
B65B 57/14 (2013.01); B65B 39/00 (2013.01); G01G 19/52 (2013.01);
Abstract

Provided is a weighing and packaging system including: a weighing unit which weighs and sequentially discharges articles; a discharge chute through which the articles discharged from the weighing unit pass; a foreign matter detecting unit which detects the foreign matter contained in the article passing through the discharge chute; a memory unit which stores quality information pertaining to the quality of the article based on a detection result of the foreign matter detecting unit; and a control unit which controls the memory unit, in which in a case where the foreign matter is detected by the foreign matter detecting unit with respect to the N(N is an integer of 2 or more) article discharged from the weighing unit, the control unit controls the memory unit to forcibly store the quality information of the (N−1)article discharged from the weighing unit as a poor quality.


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