The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Nov. 06, 2018
Applicant:

Rensselaer Polytechnic Institute, Troy, NY (US);

Inventors:

Ge Wang, Loudonville, NY (US);

Wenxiang Cong, Albany, NY (US);

Qingsong Yang, Troy, NY (US);

Guang Li, Troy, NY (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/00 (2006.01); G01N 23/041 (2018.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/4014 (2013.01); A61B 6/4291 (2013.01); A61B 6/484 (2013.01); G01N 23/041 (2018.02);
Abstract

A stationary in-vivo grating-enabled micro-CT (computed tomography) architecture (SIGMA) system includes CT scanner control circuitry and a number of imaging chains. Each imaging chain includes an x-ray source array, a phase grating, an analyzer grating and a detector array. Each imaging chain is stationary and each x-ray source array includes a plurality of x-ray source elements. Each imaging chain has a centerline, the centerlines of the number of imaging chains intersect at a center point and a first angle between the centerlines of a first adjacent pair of imaging chains equals a second angle between the centerlines of a second adjacent pair of imaging chains. A plurality of selected x-ray source elements of a first x-ray source array is configured to emit a plurality of x-ray beams in a multiplexing fashion.


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