The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Jul. 02, 2019
Applicant:

Haag-streit Ag, Koeniz, CH;

Inventors:

Lucio Robledo, Bern, CH;

Peter Stalder, Niederhünigen, CH;

André Huber-Meznaric, Köniz, CH;

Assignee:

Haag-Streit AG, Koeniz, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2022.01); A61B 3/10 (2006.01); G01B 9/02015 (2022.01); G01B 9/02091 (2022.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); G01B 9/02028 (2013.01); G01B 9/02091 (2013.01);
Abstract

The invention relates to an OCT system, comprising: an OCT light source for emitting OCT light into an object beam path and a reference beam path; and a detector for capturing an interference signal produced from the object beam path and the reference beam path. A wavelength-dependent beamsplitter is arranged in the OCT beam path such that a first spectral partial beam is guided along a longer path and a second spectral partial beam is guided along a shorter path. The invention further relates to a corresponding OCT method. Two measurement regions separated from each other can be sensed by means of the OCT system according to the invention.


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