The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Jan. 04, 2021
Canon Kabushiki Kaisha, Tokyo, JP;
Yu Miyajima, Tochigi, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
Provided is a light scanning apparatus including a deflector deflecting a light flux to scan a scanned surface, and an imaging optical element including an optical surface and guiding light flux from deflector to scanned surface. The light scanning apparatus causes a first marginal ray on a side closer to a first deflection point on deflector in a first cross section including first deflection point and being perpendicular to a main scanning section and a sub-scanning section, the first marginal ray being included in an on-axis light flux reflected by the optical surface after being deflected at first deflection point, to travel toward a position spaced apart from first deflection point in a sub-scanning direction by 4 mm or more in first cross section. A sub-scanning width of on-axis light flux on first cross section is smaller than a sub-scanning width of on-axis light flux on optical surface.