The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Sep. 30, 2020
Applicants:

Wing Chau NG, Kanata, CA;

Xuefeng Tang, Ottawa, CA;

Zhuhong Zhang, Ottawa, CA;

Inventors:

Wing Chau Ng, Kanata, CA;

Xuefeng Tang, Ottawa, CA;

Zhuhong Zhang, Ottawa, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/50 (2013.01); H04B 10/077 (2013.01); H04L 27/36 (2006.01); H04L 27/227 (2006.01); H04L 27/04 (2006.01);
U.S. Cl.
CPC ...
H04L 27/364 (2013.01); H04B 10/077 (2013.01); H04B 10/5057 (2013.01); H04L 27/04 (2013.01); H04L 27/227 (2013.01);
Abstract

Methods and apparatus for coherent transmitter calibration are provided that employ direct detection (DD) using one single photodetector (PD). The provided method and apparatus do not require hardware for coherent reception, or additional ADCs for quality control. An additional optical tone is added to a QAM optical signal that is outside the band of the QAM optical signal. The result of this is that after direct detection, there is a correlation between the real and imaginary parts, and the imaginary part can be recovered with a Hilbert transform. The estimated QAM optical signal obtained by direct detection is used to perform a transmitter factory calibration method to calibrate for one or more transmitter impairments and/or to perform in-line self-calibration.


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