The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Oct. 12, 2019
Applicant:

National Instruments Corporation, Austin, TX (US);

Inventors:

Nikhil U. Kundargi, Round Rock, TX (US);

Venkata Siva Santosh Ganji, Bryan, TX (US);

Ahsan Aziz, Austin, TX (US);

James Wesley McCoy, Leander, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04W 16/28 (2009.01); H04B 7/06 (2006.01); H04W 72/04 (2009.01); H04B 17/318 (2015.01); H04W 24/10 (2009.01); H04B 17/336 (2015.01); H04W 80/02 (2009.01);
U.S. Cl.
CPC ...
H04B 7/0695 (2013.01); H04B 7/0617 (2013.01); H04B 17/318 (2015.01); H04B 17/336 (2015.01); H04W 16/28 (2013.01); H04W 24/10 (2013.01); H04W 72/0413 (2013.01); H04W 80/02 (2013.01);
Abstract

A UE determines a beam coherence interval metric that is a measure of stability of a beam pair over time based on a set of beam coherence intervals measured by the UE. The beam pair comprises a UE receive beam and a base station transmit beam. A beam coherence interval comprises a time duration within which a quality of a signal received on the UE receive beam remains within one of a plurality of signal quality bins. The UE reports the metric to the base station. The base station may update beam management resource and reporting configurations to the UE based on the metric. The UE may also use the metric to determine a hysteresis value useable by the UE to decide to switch from an active receive beam to a different receive beam having a higher signal quality by at least the hysteresis value.


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