The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Nov. 16, 2020
Applicant:

Ronald Quan, Cupertino, CA (US);

Inventor:

Ronald Quan, Cupertino, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03G 11/08 (2006.01); H03G 3/30 (2006.01); H04R 29/00 (2006.01); H04R 3/04 (2006.01);
U.S. Cl.
CPC ...
H03G 11/08 (2013.01); H03G 3/3005 (2013.01); H04R 29/001 (2013.01);
Abstract

A system is provided to analyze frequency (or phase) modulation distortion in an audio device, which may include testing with audio frequencies. In one embodiment a change in pitch (or frequency) is measured at an output of the audio device. One or more distortion signals from the audio device may be measured for an amplitude, phase, and or frequency modulation effect. In another embodiment a musical signal may be used as a test signal. Providing additional test signals to the audio device can induce a time varying cross-modulation distortion signal (or static cross-modulation distortion signal) from an output of the audio device. Also utilizing at least one additional filter, filter bank, demodulator and or frequency converter and or frequency multiplier provides extra examination of distortion. Also frequency and or phase response can be measured with the presence of a de-sensing signal and or another signal that induce near slew rate limiting or near overload condition of the device under test. Another system is provided to analyze modulation index differences between input and output signals for a test signal including modulation.


Find Patent Forward Citations

Loading…