The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Mar. 07, 2017
Ge-hitachi Nuclear Energy Americas Llc, Wilmington, NC (US);
Mark A. Sapia, Canton, CT (US);
GE-HITACHI NUCLEAR ENERGY AMERICAS LLC, Wilmington, NC (US);
Abstract
NDE probes provide unique data signals from a remote object such that can be used to accurately and precisely locate a position. With a computer processor, the data signals are converted into a positional fingerprint that is compact and easily analyzed as a file or information of probe position. The positional fingerprint is stored in association with the position or object to verify a same position at another time. Another probe detects other data signals for the object at another time. Under a similar transformation into a positional fingerprint, the position of the other probe can be matched to the first by comparing positional fingerprints. The comparison may use a probabilistic comparison and/or compare several different fingerprints from several different locations and times to ensure a best match. Position verification between probes may ensure a repair has been completed in the proper location, verify system integrity or investigate potential problems.