The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Feb. 28, 2017
Nec Corporation, Tokyo, JP;
Takami Sato, Tokyo, JP;
Kota Iwamoto, Tokyo, JP;
Yoshinori Saida, Tokyo, JP;
Shin Norieda, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
Provided is a technology for recording effective data, as a result of inspection on a to-be-inspected object. This inspection assistance device is provided with: a reception unit that receives information about a to-be-inspected object; an acquisition unit that acquires image data captured by an imaging device; and a recording control unit that, in the case when the imaging time of the image data falls within a prescribed time range based on the time at which the information was received being set as a reference, and when the to-be-inspected object indicated by the received information coincides with the to-be-inspected object recognized from the image data, records the information pertaining to the result of inspection on the to-be-inspected object and the information about the to-be-inspected object in association with each other.