The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Dec. 11, 2019
Shenzhen Sensetime Technology Co., Ltd., Shenzhen, CN;
Wenxiu Sun, Shenzhen, CN;
SHENZHEN SENSETIME TECHNOLOGY CO., LTD., Shenzhen, CN;
Abstract
A dual-view angle image calibration method includes: performing feature matching on a first image pair to obtain a first feature point pair set, the first image pair including two images respectively photographed corresponding to two different view angles of a same scene; obtaining multiple different first fundamental matrices of the first image pair at least according to the first feature point pair set, and obtaining first image deformation information indicating relative deformation between the first image pair after mapping transformation is performed through the first fundamental matrices and the first image pair before the mapping transformation is performed; determining a first optimization fundamental matrix from the multiple first fundamental matrices at least according to the first image deformation information; and calibrating the first image pair according to the first optimization fundamental matrix.