The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Jan. 27, 2021
Applicant:

National Yang-ming University, Taipei, TW;

Inventors:

Yu-Wei Chang, New Taipei, TW;

Albert Chihchieh Yang, Taipei, TW;

Shih-Jen Tsai, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0014 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30016 (2013.01);
Abstract

A method for determining whether there is an abnormality in a brain includes steps of: receiving a to-be-determined (TBD) 3D brain image; implementing the calibration procedure on the TBD 3D brain image; generating a first TBD image of WM, a second TBD image of GM, and a third TBD image of CSF based on a multi-voxel pattern of the TBD 3D brain image; and inputting the first TBD image of WM into a first DNN model, the second TBD image of GM into a second DNN model, and the third TBD image of CSF into a third DNN model to determine whether there is an abnormality in the white matter, the gray matter and the cerebrospinal fluid, respectively.


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