The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Jan. 08, 2019
Konica Minolta, Inc., Tokyo, JP;
Yusuke Mimura, Hino, JP;
Makoto Oki, Hino, JP;
KONICA MINOLTA, INC., Tokyo, JP;
Abstract
An image inspection device that determines a defect in an image of a surface to be inspected of a printed matter, based on a comparison between a captured image obtained by capturing the surface to be inspected and a master image includes a hardware processor that acquires the captured image and the master image, wherein the hardware processor: acquires region information about an image in a region having a predetermined area; specifies a processing technique of image alignment for each region in relation to the region information; executes at least an alignment process in relation to the region information as a process before the comparison by the specified alignment technique; and compares the captured image and the master image, on which the process before the comparison has been performed, and performs defect determination as to whether there is a defect in the captured image based on a comparison result.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile