The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Mar. 20, 2020
Applicant:

Huawei Technologies Co., Ltd., Guangdong, CN;

Inventors:

Wanlong Li, Beijing, CN;

Feng Wen, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); B25J 9/16 (2006.01); G06F 17/16 (2006.01); G06V 10/75 (2022.01);
U.S. Cl.
CPC ...
G06K 9/6289 (2013.01); B25J 9/1694 (2013.01); G06F 17/16 (2013.01); G06K 9/6288 (2013.01); G06V 10/754 (2022.01); G06V 10/76 (2022.01);
Abstract

The method includes: determining a reference sensor from at least two sensors and sampling moments of the reference sensor; when obtaining observation data of a sensor K at a moment t, determining a type of the sensor K; if the sensor K is a first sensor of a first type, determining a sampling moment Tthat is closest to tand an interpolation coefficient λ, and calculating first rotation data and first translation data that are at T, and a first covariance matrix; if the sensor K is a second sensor of a second type, determining two sampling moments Tand Tthat are closest to tand interpolation coefficients λand λ, and calculating second rotation data and second translation data that are of the second sensor from Tto T, and a second covariance matrix; merging rotation data, translation data, and covariance matrices that are at the sampling moments.


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