The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Mar. 04, 2020
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Nao Mishima, Inagi Tokyo, JP;

Tatsuo Kozakaya, Kawasaki Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06K 9/62 (2022.01); G06F 17/18 (2006.01); G06N 20/00 (2019.01); G06V 10/22 (2022.01); G06V 20/64 (2022.01);
U.S. Cl.
CPC ...
G06K 9/6257 (2013.01); G06F 17/18 (2013.01); G06K 9/6265 (2013.01); G06N 20/00 (2019.01); G06V 10/22 (2022.01); G06V 20/653 (2022.01);
Abstract

According to one embodiment, a learning method for causing a second statistical model to learn using a first statistical model is provided. The method includes obtaining a first learning image, cutting out each local area of the obtained first learning image, and obtaining a first prediction value output from the first statistical model by inputting each local area to the first statistical model and obtaining a second prediction value output from the second statistical model by inputting the entire area of the first learning image to the second statistical model, and causing the second statistical model to learn based on a difference between the first prediction value and the second prediction value.


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