The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Feb. 12, 2018
Applicant:
Ctilab Co., Ltd., Seoul, KR;
Inventors:
Assignee:
CTILAB CO., LTD., Seoul, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06K 9/00 (2022.01); G06N 3/08 (2006.01); G10L 25/18 (2013.01);
U.S. Cl.
CPC ...
G06K 9/6256 (2013.01); G06K 9/00496 (2013.01); G06N 3/08 (2013.01); G10L 25/18 (2013.01);
Abstract
Disclosed is a method of analyzing abnormal behavior by using data imaging, including: receiving data to be analyzed as an input, wherein the data to be analyzed is related to a state of a system to be analyzed; converting the inputted data to be analyzed into image data; training a neural network unit with the converted image data as an input; and detecting or predicting abnormal behavior in the system to be analyzed, at the neural network unit, which has received the image data converted from the data to be analyzed as the input and completed training.