The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Feb. 20, 2018
Kabushiki Kaisha Toshiba, Tokyo, JP;
Sayaka Akiyama, Yokohama Kanagawa, JP;
Kohei Maruchi, Tokyo, JP;
Masatake Sakuma, Ichikawa Chiba, JP;
KABUSHIKI KAISHA TOSHIBA, Tokyo, JP;
Abstract
An apparatus as an aspect of the present invention is a factor analysis apparatus that analyzes a relationship between a target event that is a target of factor analysis and an assumed factor of the target event, and includes a similarity calculator, a first influence calculator, and a second influence calculator. The similarity calculator calculates a degree of similarity between a data item included in provided time-series data and the assumed factor. The first influence calculator calculates a first degree of influence indicating a degree of influence of the data item on the target event on the basis of time-series data of the data item and time-series data of the target event. The second influence calculator calculates a second degree of influence indicating a degree of influence of the assumed factor on the target event on the basis of the degree of similarity and the first degree of influence.