The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Aug. 31, 2017
Applicant:

Okera, Inc., San Francisco, CA (US);

Inventors:

Amandeep Khurana, San Francisco, CA (US);

Nong Li, San Francisco, CA (US);

Assignee:

Okera, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/30 (2019.01); G06F 16/14 (2019.01); G06F 8/60 (2018.01); G06F 9/445 (2018.01); G06F 16/2457 (2019.01);
U.S. Cl.
CPC ...
G06F 16/144 (2019.01); G06F 8/60 (2013.01); G06F 9/44505 (2013.01); G06F 16/2457 (2019.01);
Abstract

Disclosed herein provides enhancements for operating a data access system for large data processing environments. In one implementation, a method provides for receiving a data query from at least one of the multiple application services and identifying metadata that defines policies for deploying the queried data. The method further provides retrieving the queried data from at least one of the multiple storage services, generating a data configuration containing the retrieved data based on standardized parameters and the policies defined by the metadata, and deploying the data configuration to the at least one of the multiple application services.


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