The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Dec. 15, 2020
International Business Machines Corporation, Armonk, NY (US);
Andrew C. M. Hicks, Highland, NY (US);
Kevin Minerley, Red Hook, NY (US);
Dale E. Blue, Poughkeepsie, NY (US);
Ryan Thomas Rawlins, New Paltz, NY (US);
Daniel Nicolas Gisolfi, Hopewell Junction, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Inputs to a system under test (SUT) are modeled as a collection of attribute-value pairs. A set of testcases is executed using an initial set of test vectors that provides complete n-wise coverage of the attribute-value pairs. For each execution of the testcases, for each attribute-value pair, a non-binary success rate (S) is computed based on the binary execution results. The method further includes outputting, to a user, in response to the success rate Sof the attribute-value pair being below a predetermined threshold, an identification of one or more testcases that use the attribute-value pair, wherein the one or more testcases are to be used for diagnosing a soft failure associated with the SUT.