The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Jun. 21, 2018
Applicant:
Hewlett-packard Development Company, L.p., Spring, TX (US);
Inventors:
Suketu Partiwala, Palo Alto, CA (US);
Chihao Lo, Palo Alto, CA (US);
Dhruv Jain, Palo Alto, CA (US);
Jeff J Liu, Fremont, CA (US);
Michael Leighton Nash, Clyde Hill, WA (US);
Gary Calomeni, Palo Alto, CA (US);
Assignee:
Hewlett-Packard Development Company, L.P., Spring, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/08 (2006.01); G06F 11/34 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3428 (2013.01); G06F 1/08 (2013.01); G06F 11/3024 (2013.01); G06F 11/3062 (2013.01);
Abstract
A method of automatic overclocking of a silicon part or chip, such as a central processing unit (CPU) is disclosed. A range of clock frequencies of both the CPU and a cache of a computer system are tested, with parameters being monitored, safety limits of the computer system being ensured, and benchmark tests being run, before arriving at a CPU and cache frequencies based on a selected benchmark score.