The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Feb. 14, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Xiao Yin Zhou, Beijing, CN;

Zhenni Yan, Beijing, CN;

Ya Ling Xu, Beijing, CN;

Xin Peng Liu, Beijing, CN;

Qian Xu, Beijing, CN;

Chao Feng, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/71 (2018.01); G06F 8/75 (2018.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 8/71 (2013.01); G06F 8/75 (2013.01); G06F 11/3624 (2013.01);
Abstract

A plurality of metadata corresponding to a plurality of code versions of an application stored in a version control system is generated. A determination is made of a set of changes between a first metadata of a first code version and a second metadata of a second code version. A classification is made of elements in the set of changes into a first category and a second category based on a set of predetermined rules, wherein the elements classified into the first category are better candidates to determine causes of defects in the application than the elements classified into the second category. The elements classified in the first category are used to determine a cause of a defect in the application.


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