The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Sep. 29, 2020
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Brian O'Halloran, Carrigaline, IE;

Siobhan McLoughlin, Crookstown, IE;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/065 (2013.01); G06F 3/067 (2013.01); G06F 3/0619 (2013.01);
Abstract

Techniques for determining a compliance level may include: receiving a remote replication policy for a data set; determining a current remote replication configuration of the data set; and performing evaluation processing that determines, in accordance with the remote replication policy for the data set, the compliance level for remote replication of the data set, wherein said evaluation processing includes verifying that the topology of the current remote replication configuration for the data set matches a specified topology of the remote replication policy for the data set.


Find Patent Forward Citations

O'Halloran, Brian. (2022). Compliance of replicated data sets (U.S. Patent No. 11379144). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11379144

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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