The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Oct. 10, 2017
Nec Corporation, Tokyo, JP;
Masanao Natsumeda, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A system analysis method includes: acquiring history information indicating, based on sensor values outputted by sensors, whether one of sensor values outputted by respective sensors indicates abnormality and/or whether individual relationship between sensor values outputted by different sensors indicates abnormality in time-series manner; estimating a change point group of change points, each indicating a time point system state has changed, based on history information; estimating relevance levels, each indicating relevance to the system state between two arbitrary time points included in the change point group; generating groups of change point groups by classifying the change point group into a plurality of groups based on the history information and the relevance levels; and generating and outputting output information, as information relating abnormality per group of the change point groups.