The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Nov. 15, 2016
Applicant:

Mitsubishi Electric Corporation, Chiyoda-ku, JP;

Inventors:

Seigo Fujita, Chiyoda-ku, JP;

Masakazu Miya, Chiyoda-ku, JP;

Yuki Sato, Chiyoda-ku, JP;

Hayato Shiono, Chiyoda-ku, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 19/07 (2010.01); G01S 19/08 (2010.01); G01S 19/28 (2010.01);
U.S. Cl.
CPC ...
G01S 19/073 (2019.08); G01S 19/08 (2013.01); G01S 19/28 (2013.01);
Abstract

A local error estimation unit () of a local error generation device () estimates and generates local errors (δT, δI) based on global errors (δo, δt, δb) included in positioning augmentation information () produced in an electronic reference point network () and observed data () generated by receivers on electronic reference points () not belonging to the electronic reference point network (). The local errors (δT, δI) are errors that influence positioning accuracy in a region where the electronic reference points () exist and that depend on the region where the electronic reference points () exist.


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