The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Oct. 06, 2020
Applicant:

Leica Geosystems Ag, Heerbrugg, CH;

Inventors:

Gregory C. Walsh, Walnut Creek, CA (US);

Ashavini Pavaskar, San Ramon, CA (US);

Assignee:

LEICA GEOSYSTEMS AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G01S 17/894 (2020.01); G06T 7/90 (2017.01); G01S 17/86 (2020.01);
U.S. Cl.
CPC ...
G01S 17/894 (2020.01); G01S 17/86 (2020.01); G06T 7/90 (2017.01); H04N 5/23229 (2013.01);
Abstract

In one example, a method may include receiving one or more laser scan of a scene, receiving two or more camera images of the scene, determining one or more decision regions where the camera images are different from one another, detecting edges of the decision regions where the camera images are different from one another, comparing the decision regions where the camera images are different from one another inside of the detected edges with a corresponding region in the laser scan to determine which of the camera images includes a desired region that more closely corresponds to the laser scan, and generating a corrected image including the desired region that more closely corresponds to the laser scan.


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