The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Aug. 06, 2019
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Steffen Neidhardt, Munich, DE;
Frank Gumbmann, Munich, DE;
Sherif Sayed Ahmed, Munich, DE;
Benedikt Simper, Munich, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A method for determining the three-dimensional alignment of components of a radar system is described. The radar system is provided that comprises at least one portion which is permeable by radar signals. The radar system is imaged by using millimeter waves emitted by an imaging system. In the image obtained, it is determined the highest magnitude reflection coinciding with at least one of an expected location and an expected distance of the surface of a first component of the radar system being of interest. At least one of the position and the distance of that surface is determined. From the measurement, the relative phase information received from each portion of that surface at the determined position and/or the determined distance is obtained. Processing the phase information obtained so as to obtain the azimuth and tilt of the surface. Further, a testing system is described.