The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Mar. 18, 2021
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Ayaka Ikegawa, Tokyo, JP;

Masahiro Takizawa, Tokyo, JP;

Hisako Nagao, Tokyo, JP;

Tomohiro Gotou, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/54 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G01R 33/543 (2013.01); G01R 33/5608 (2013.01);
Abstract

Imaging failure of a positioning image due to the difference in the position or the size of a subject placed in the examination space is prevented, and accordingly, the extension of the examination time is prevented. A pre-scan for appropriately setting the imaging position for positioning imaging is automatically performed prior to the positioning imaging and the main imaging of an MRI apparatus, and a region where an examination part of a subject is present (the extent of the examination part) is detected using the measurement data. By using the detected extent of the examination part, it is possible to subsequently determine the imaging position or calculate the scan parameters used for imaging.


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