The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Nov. 14, 2018
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Yunqing Huang, Shanghai, CN;

Wenjian Sun, Shanghai, CN;

Xiaoqiang Zhang, Shanghai, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/86 (2006.01); G01N 30/72 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
G01N 30/8651 (2013.01); G01N 30/7233 (2013.01); G01N 30/8637 (2013.01); H01J 49/0036 (2013.01);
Abstract

A data acquisition and analysis method for a mass spectrometer includes providing at least one ion source for generating ions, the generated ions containing ions of a substance to be analyzed; dividing the full mass-to-charge ratio range of the ions of the substance into several mass-to-charge ratio windows, feeding ions corresponding to different mass-to-charge ratio windows into a collision cell to fragment at least part of the corresponding ions, and recording mass spectra of the ions passing through the collision cell as corresponding product ion spectra; obtaining a mass-to-charge ratio window corresponding to the product ion spectra obtained by the searching; within the mass-to-charge ratio range of the obtained mass-to-charge ratio window, obtaining ion peaks from the product ion spectra obtained by the searching; and determining whether ions corresponding to the obtained ion peaks are precursor ions corresponding to the product ion spectra obtained by the searching.


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