The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

May. 30, 2018
Applicant:

Massachusetts Materials Technologies Llc, Waltham, MA (US);

Inventors:

Simon C. Bellemare, Weston, MA (US);

Steven D. Palkovic, Somerville, MA (US);

Brendon M. Willey, Dedham, MA (US);

Phillip A. Soucy, Cambridge, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/44 (2006.01); G01N 3/46 (2006.01); G01N 3/60 (2006.01); G01N 19/06 (2006.01); G06N 5/04 (2006.01);
U.S. Cl.
CPC ...
G01N 3/44 (2013.01); G01N 3/46 (2013.01); G01N 3/60 (2013.01); G01N 19/06 (2013.01); G01N 2203/0053 (2013.01); G01N 2203/0066 (2013.01); G01N 2203/0078 (2013.01); G06N 5/04 (2013.01);
Abstract

An apparatus for performing a contact mechanics test in a substrate includes a stylus having at least two contact elements. Each contact element has a contact profile, and the contact elements are disposed in the stylus to define a stretch passage therebetween. The stylus is configured to deform the substrate so as to cause the substrate to flow between the contact elements and induce tension in the substrate in order to generate and preserve micromodifications in the substrate. Methods of performing a contact mechanics test using the apparatus are also provided.


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