The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Sep. 14, 2020
Applicant:

Montana Instruments Corporation, Bozeman, MT (US);

Inventors:

William Baker, Broomfield, CO (US);

Isaac Henslee, Bozeman, MT (US);

Luke Mauritsen, Belgrade, MT (US);

Anjan Reijnders, Groton, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/42 (2006.01); G01N 21/01 (2006.01);
U.S. Cl.
CPC ...
G01N 1/42 (2013.01); G01N 21/01 (2013.01);
Abstract

Instrumental analysis systems are provided that can include: an analytical attachment axially aligned with a sample upon a sample stage; structure supporting both the attachment and the sample stage; and at least one band affixed to the analytical attachment and aligned symmetrically about the axis of the attachment. Methods for analyzing samples are provided. The methods can include: providing at least one band supported by a structure; firmly affixing an analytical attachment to the band, and axially aligning the attachment with a sample; and providing a temperature gradient between the band and the sample while maintaining axial alignment of the objective and the sample.


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