The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Feb. 26, 2019
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
Hiroshi Takahashi, Musashino, JP;
Tomokazu Oda, Musashino, JP;
Kunihiro Toge, Musashino, JP;
Tetsuya Manabe, Musashino, JP;
NIPPON TELEGRAPH AND TELEPHONE CORPORATION, Tokyo, JP;
Abstract
An object is to provide a propagation property analyzing apparatus that can alleviate the influence of an error caused by crosstalk, and accurately evaluate a few-mode optical fiber that multiplexes a plurality of modes, in a distributional and non-destructive manner. Provided is a propagation property analyzing apparatus that analyzes propagation properties of a few-mode optical fiber that multiplexes a plurality of modes, which is an optical fiber under test, in a lengthwise direction thereof, through Brillouin time domain analysis, the propagation property analyzing apparatus including: means for inputting probe light in a desired mode from a distal end of the optical fiber under test; means for inputting a light pulse that is in the desired mode and that has a frequency difference equivalent to a Brillouin frequency shift in the desired mode, relative to the probe light, from a proximal end of the optical fiber under test, as pump light corresponding to the probe light; and means for inputting a light pulse that is in another mode different from the desired mode and that has a frequency difference equivalent to a Brillouin frequency shift in the other mode, relative to the probe light, as secondary probe light corresponding to the probe light, from the proximal end of the optical fiber under test.