The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

May. 18, 2018
Applicant:

Teledyne Flir, Llc, Thousand Oaks, CA (US);

Inventors:

Jeffrey D. Frank, Santa Barbara, CA (US);

Michael Kent, Goleta, CA (US);

Anna-Karin Lindblom, Taby, SE;

Lei Bennett, Santa Barbara, CA (US);

Andrew C. Teich, West Linn, OR (US);

Assignee:

Teledyne FLIR, LLC, Thousand Oaks, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2022.01); G01J 5/02 (2022.01); H02S 50/00 (2014.01); G01J 5/061 (2022.01); G06V 20/13 (2022.01); G01J 5/06 (2022.01); H04N 5/235 (2006.01); H04N 5/243 (2006.01); H04N 5/33 (2006.01); B64C 39/02 (2006.01); G03B 15/00 (2021.01); G08G 5/00 (2006.01); H02S 50/15 (2014.01); H04N 7/18 (2006.01); G01J 5/80 (2022.01); H02J 4/00 (2006.01); H04W 84/18 (2009.01);
U.S. Cl.
CPC ...
G01J 5/00 (2013.01); B64C 39/024 (2013.01); G01J 5/007 (2013.01); G01J 5/0265 (2013.01); G01J 5/06 (2013.01); G01J 5/061 (2013.01); G03B 15/006 (2013.01); G06V 20/13 (2022.01); G08G 5/0091 (2013.01); H02S 50/00 (2013.01); H02S 50/15 (2014.12); H04N 5/2351 (2013.01); H04N 5/243 (2013.01); H04N 5/33 (2013.01); H04N 7/185 (2013.01); B64C 2201/123 (2013.01); B64C 2201/127 (2013.01); B64C 2201/141 (2013.01); B64C 2201/146 (2013.01); G01J 5/064 (2022.01); G01J 5/80 (2022.01); G01J 5/804 (2022.01); G01J 2005/0077 (2013.01); H02J 4/00 (2013.01); H04W 84/18 (2013.01);
Abstract

Flight based infrared imaging systems and related techniques, and in particular UAS based thermal imaging systems, are provided to improve the monitoring capabilities of such systems over conventional infrared monitoring systems. An infrared imaging system is configured to compensate for various environmental effects (e.g., position and/or strength of the sun, atmospheric effects) to provide high resolution and accuracy radiometric measurements of targets imaged by the infrared imaging system. An infrared imaging system is alternatively configured to monitor regulatory limitations on operation of the infrared imaging system and adjust and/or disable operation of the infrared imaging systems accordingly.


Find Patent Forward Citations

Loading…