The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Oct. 11, 2016
Applicant:

Hp Indigo B.v., Amstelveen, NL;

Inventors:

Nir Guttman, Ness Ziona, IL;

Ziv Berkovich, Ness Ziona, IL;

Gil Arie Uner, Ness Ziona, IL;

Assignee:

HP Indigo B.V., Amstelveen, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01); G01J 3/28 (2006.01); G01J 3/50 (2006.01);
U.S. Cl.
CPC ...
G01J 3/462 (2013.01); G01J 3/28 (2013.01); G01J 3/50 (2013.01);
Abstract

In an example of the disclosure, a device () includes: an acquiring unit to obtain first reflectance output values acquired from reference samples () by a reference color measuring device and to obtain second reflectance output values acquired from the reference samples () by a second color measuring device (); a processing unit to determine, for a plurality of wavelength values, correspondences between a first reflectance output value acquired by the reference color measuring device and a second reflectance output value acquired by the second color measuring device, and to perform, for each wavelength value, an interpolation based on the correspondences to obtain interpolation data; and a correcting unit to correct, based on the interpolation data, third reflectance output values acquired by the second color measuring device () from a sample of interest ().


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