The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Mar. 05, 2018
Applicant:

Satake Corporation, Tokyo, JP;

Inventors:

Shigeki Uebayashi, Tokyo, JP;

Takeshi Okamoto, Tokyo, JP;

Koji Kawakami, Tokyo, JP;

Assignee:

SATAKE CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01G 11/04 (2006.01); G01F 1/05 (2006.01); G01G 13/24 (2006.01); G01G 17/06 (2006.01);
U.S. Cl.
CPC ...
G01G 11/04 (2013.01); G01F 1/05 (2013.01); G01G 13/247 (2013.01); G01G 17/06 (2013.01);
Abstract

A flow rate measurement device improves the flow rate measurement accuracy without increasing the size of the metering tank. The flow rate measurement device includes a metering tank having a supply port at its upper portion and a discharge port at its lower portion, an on-off valve that opens and closes a flow channel inside the metering tank, a weight measurement unit that measures a weight of the metering tank, and flow rate computing unit that supplies powders and/or grains continuously from the supply port to the metering tank, computes a flow rate of the powders and/or grains multiple times in a temporally-overlapped state on the basis of the weight of the metering tank measured by the weight measurement unit in a state where the on-off valve is closed, and computes an average flow rate of the powders and/or grains on the basis of the flow rate computed multiple times.


Find Patent Forward Citations

Loading…