The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
May. 27, 2020
Shhuna Gmbh, Munich, DE;
Juri Platonov, Grünwald, DE;
Pawel Kaczmarczyk, Kaufering, DE;
Shhuna GmbH, Munich, DE;
Abstract
A method of sensor fusion for systems including at least one sensor and at least one target object is provided. The method includes receiving configuration data at a processing device. The configuration data includes a description of a first system including one or more sensors and one or more target objects. The configuration data includes an indication that one or more geometric parameters and/or one or more sensor parameters of the first system are unknown. The method includes receiving an instruction at the processing device that the received configuration data is to be adjusted into adjusted configuration data. The adjusted configuration data includes a description of a second system including one or more sensors and one or more target objects, wherein the second system is different from the first system. The adjusted configuration data includes an indication that one or more geometric parameters and/or one or more sensor parameters of the second system are unknown. The method includes receiving, for each sensor of the second system, measurement data resulting from a plurality of measurements performed by the sensor. The method includes determining an optimization problem using the processing device, wherein each unknown geometric parameter and each unknown sensor parameter of the second system are associated with one or more variables of the optimization problem. The method includes determining a value of each unknown geometric parameter and a value of each unknown sensor parameter of the second system by solving the optimization problem using the processing device.