The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Jul. 22, 2019
University of South Florida, Tampa, FL (US);
Justin Nussbaum, Knoxville, TN (US);
Nathan Brad Crane, Lutz, FL (US);
University of South Florida, Tampa, FL (US);
Abstract
The disclosed subject matter relates to methods for monitoring or controlling a manufacturing process of a material by determining when a variation in surface characteristics takes place. Such surface characteristics correlates to the processing condition of the material and can include density, roughness, porosity, or planarity on a surface of the material. The methods can include herein can include directing a solvent or energy on a surface of the material to form an at least partially modified surface, directing light at an incident angle with respect to the at least partially modified surface, measuring one or more predetermined properties of light reflected from the at least partially modified surface, determining that the material is fully processed based on the measured predetermined property of the light reflected, and optionally adjusting a processing parameter of the manufacturing process in response to the measured predetermined property.