The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
May. 28, 2019
Riken, Wako, JP;
Nissan Chemical Corporation, Tokyo, JP;
Naohiro Kanda, Wako, JP;
Takaoki Takanashi, Wako, JP;
RIKEN, Saitama, JP;
Nissan Chemical Corporation, Tokyo, JP;
Abstract
In an embodiment of the present disclosure, in order to raise the reproducibility of a reconstructed tomographic image without increasing a calculation load, any one among two directions adjacent to two boundaries that demarcate an angular scan range is offset from any one among coordinate axes of a two-dimensional tomographic image of N pixels×N pixels, and the angle of the offset is made to be above 0 degrees and under 90 degrees or above −90 degrees and under 0 degrees. A detection device, which includes N detection elements, performs detection in each detection direction, and a first vector having N×N elements is obtained from a detection signal obtained by the detection device in a detection operation. A discrete Inverse Radon transform matrix is applied to the first vector to obtain a second vector having N×N elements. The second vector is de-vectorized to obtain image data for a two-dimensional tomographic image of N pixels×N pixels. An inverse matrix of a system matrix for an offset is obtained and used as the discrete Inverse Radon transform matrix.