The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Jun. 30, 2020
Applicant:
Topcon Corporation, Tokyo, JP;
Inventors:
Assignee:
TOPCON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2022.01); A61B 3/10 (2006.01); A61B 5/00 (2006.01); G01B 9/02091 (2022.01); G06T 7/32 (2017.01); A61B 3/00 (2006.01); A61B 3/12 (2006.01); G06T 3/00 (2006.01); G06T 3/20 (2006.01); G06T 3/60 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/0025 (2013.01); A61B 3/12 (2013.01); A61B 5/0066 (2013.01); G01B 9/02083 (2013.01); G01B 9/02091 (2013.01); G06T 3/0068 (2013.01); G06T 3/20 (2013.01); G06T 3/60 (2013.01); G06T 7/32 (2017.01); G06T 2200/04 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/30041 (2013.01);
Abstract
An exemplary aspect is a method of processing data acquired by applying an optical coherence tomography (OCT) scan to a sample. The method includes preparing a three dimensional data set acquired from a sample, creating a two dimensional map based on representative intensity values of a plurality of pieces of A-scan data included in the three dimensional data set, placing the three dimensional data set based on the two dimensional map, and executing a process based on at least a partial data set of the three dimensional data set on which placement based on the two dimensional map has been performed.