The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Jun. 19, 2017
G.d S.p.a., Bologna, IT;
G.D S.p.A., Bologna, IT;
Abstract
A transferring and inspection unit for transferring and inspecting a group of elongated elements that are rod-shaped for smoking articles that includes a forming pocket, having a longitudinal axis, which is provided with a hollow housing suitable for housing a group of elongated elements to be inspected; a transporting conveyor of the forming pocket which is configured to advance the pocket along an advancing path through a first inspection position; a first tridimensional inspecting optical assembly configured to perform in respective successive scanning instants a plurality of first tridimensional optical scans by projecting a first light blade over a first head face of the group, during advancing of the forming pocket through the first inspection position; a processing device configured to obtain, for each first tridimensional scan, a respective first scanning line associated with the respective scanning instant and to reconstruct a first tridimensional profile of the first head face on the basis of the plurality of the first scanning lines, positioned in respective first reference positions. The forming pocket includes a first front face that in turn includes a first shaped surface be the first optical assembly is configured to perform simultaneously with each first tridimensional scan of the first head face also a respective first tridimensional scan of the first shaped surface to obtain a respective further scanning line; the processing device is in addition configured to calculate the reference position of each first scanning line analyzing the respective further scanning line.