The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2022
Filed:
Jul. 03, 2018
Eizo Corporation, Hakusan, JP;
Takao Maekawa, Hakusan, JP;
Kensuke Nagashima, Hakusan, JP;
Atsuyoshi Deyama, Hakusan, JP;
Takashi Nakagawa, Hakusan, JP;
Tatsuya Nakamura, Hakusan, JP;
EIZO Corporation, Hakusan, JP;
Abstract
The present invention provides a measurement method capable of measuring a physical property value of light output based on a pixel value at any coordinates in an original image. According to the present invention, provided is a measurement method including a display control step of displaying a patch image generated based on a pixel value at target coordinates in the original image, on a display screen at patch display coordinates different from the target coordinates; and a measurement control step of measuring the physical property value of the light from the patch image displayed on the display screen.