The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2022

Filed:

Nov. 29, 2019
Applicant:

Sitime Corporation, Santa Clara, CA (US);

Inventors:

Carl Arft, Ann Arbor, MI (US);

Aaron Partridge, Cupertino, CA (US);

Markus Lutz, Mountain View, CA (US);

Charles I. Grosjean, Los Gatos, CA (US);

Assignee:

SiTime Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03B 5/04 (2006.01); H03B 5/30 (2006.01); H01L 23/31 (2006.01); H01L 23/34 (2006.01); B81B 3/00 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H03B 5/04 (2013.01); B81B 3/0081 (2013.01); H01L 23/3121 (2013.01); H01L 23/345 (2013.01); H01L 24/16 (2013.01); H03B 5/30 (2013.01); B81B 2207/012 (2013.01); B81B 2207/098 (2013.01); H01L 2224/16145 (2013.01); H01L 2924/1461 (2013.01);
Abstract

One or more heating elements are provided to heat a MEMS component (such as a resonator) to a temperature higher than an ambient temperature range in which the MEMS component is intended to operate—in effect, heating the MEMS component and optionally related circuitry to a steady-state 'oven' temperature above that which would occur naturally during component operation and thereby avoiding temperature-dependent performance variance/instability (frequency, voltage, propagation delay, etc.). In a number of embodiments, an IC package is implemented with distinct temperature-isolated and temperature-interfaced regions, the former bearing or housing the MEMS component and subject to heating (i.e., to oven temperature) by the one or more heating elements while the latter is provided with (e.g., disposed adjacent) one or more heat dissipation paths to discharge heat generated by transistor circuitry (i.e., expel heat from the integrated circuit package).


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