The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2022
Filed:
Oct. 12, 2019
International Business Machines Corporation, Armonk, NY (US);
Youssef Mroueh, New York, NY (US);
Tom Sercu, New York, NY (US);
Mattia Rigotti, New York, NY (US);
Inkit Padhi, White Plains, NY (US);
Cicero Nogueira Dos Santos, Montclair, NJ (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A machine learning system receives a witness function that is determined based on an initial sample of a dataset comprising multiple pairs of stimuli and responses. Each stimulus includes multiple features. The system receives a holdout sample of the dataset comprising one or more pairs of stimuli and responses that are not used to determine the witness function. The system generates a simulated sample based on the holdout sample. Values of a particular feature of the stimuli of the simulated sample are predicted based on values of features other than the particular feature of the stimuli of the simulated sample. The system applies the holdout sample to the witness function to obtain a first result. The system applies the simulated sample to the witness function to obtain a second result. The system determines whether to select the particular feature based on a comparison between the first result and the second result.