The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2022
Filed:
Feb. 25, 2020
Photo Diagnostic Systems, Inc., Boxboro, MA (US);
Matthew Len Keeler, Bolton, MA (US);
Photo Diagnostic Systems, Inc., Boxboro, MA (US);
Abstract
A method for artifact correction in computed tomography, the method comprising: (1) acquiring a plurality of data sets associated with different X-ray energies (i.e., D, D, D. . . D); (2) generating a plurality of preliminary images from the different energy data sets acquired in Step (1) (i.e., I, I, I. . . I); (3) using a mathematical function to operate on the preliminary images generated in Step (2) to identify the sources of the image artifact (i.e., the artifact source image, or ASI, where ASI=f(I, I, I. . . I)); (4) forward projecting the ASI to produce ASD=fp(ASI); (5) selecting and combining the original data sets D, D, D. . . Din order to produce a new subset of the data associated with the artifact, whereby to produce the artifact reduced data, or ARD, where ARD=f(ASD, D, D, D. . . D); (6) generating a repaired data set (RpD) to keep low-energy data in artifact-free data and introduce high-energy data in regions impacted by the artifact, where RpD=f(ARD, D, D, D. . . D); and (7) generating a final reduced artifact image (RAI) from the repaired data, RAI=bp(RpD), where the function bp is any function which generates an image from data.