The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2022
Filed:
Jan. 05, 2021
Applicant:
Qualcomm Incorporated, San Diego, CA (US);
Inventors:
Jeong-Kyun Lee, Seoul, KR;
Young-Ki Baik, Namyangju-si, KR;
Hankyu Cho, Seoul, KR;
Dongju Kim, Seoul, KR;
Assignee:
QUALCOMM Incorporated, San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 7/50 (2017.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/75 (2017.01); G06T 7/50 (2017.01); G06T 17/00 (2013.01); G06T 2207/30244 (2013.01); G06T 2207/30252 (2013.01); G06T 2210/12 (2013.01);
Abstract
Techniques and systems are provided for determining features of one or more objects in one or more images. For example, an image of an object and a three-dimensional model associated with the object can be obtained. From the image, a sample point on the object can be determined. A depth and an angle of the sample point of the object can be determined. A pose and a shape of the three-dimensional model associated with the object can be determined based on the depth and the angle.