The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2022
Filed:
Jan. 27, 2020
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Jaemock Yi, Suwon-si, KR;
Mincheol Park, Suwon-si, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06T 7/00 (2017.01); G06T 7/593 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0014 (2013.01); A61B 6/461 (2013.01); A61B 6/505 (2013.01); A61B 6/5247 (2013.01); A61B 6/5282 (2013.01); A61B 6/544 (2013.01); A61B 6/583 (2013.01); G06T 7/593 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30008 (2013.01);
Abstract
An X-ray image processing method, including obtaining a first X-ray image of an object including a plurality of materials including a first material and a second material different from the first material; obtaining three-dimensional (3D) information about the object using a 3D camera; obtaining first information about a thickness of the object based on the 3D information; and obtaining second information related to a stereoscopic structure of the first material by decomposing the first material from the object using the first information and the first X-ray image.