The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2022
Filed:
Sep. 28, 2020
Applicants:
Walter F. Kailey, Frederick, CO (US);
Carl M. Dennison, Longmont, CO (US);
Inventors:
Walter F. Kailey, Frederick, CO (US);
Carl M. Dennison, Longmont, CO (US);
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 2207/10008 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30144 (2013.01);
Abstract
A method is disclosed. The method includes receiving one or more images of bitmap data applied to a print medium as print medium image data, register the print medium image data to the bitmap data, detecting one or more candidate defects based on whether a difference between the print medium image data at a location and the bitmap data at the location exceeds a predetermined threshold, detecting one or more defects among the candidate defects and transmitting information about the one or more candidate defects classified as defects.